“Fast, Compact and Label-Free Electrical Detection of Live and Dead Single Cells”
Dr. James C. M. Hwang
When: Monday, January 6, 2014 at 3:05 p.m.
Where: Warnock 1230
Using a novel broadband microchamber, electrical detection of live and dead single cells was demonstrated. Tests on Jurkat cells showed that live cells had lower resistance but higher capacitance than that of dead cells. The test results were compared with the limited literature on broadband electrical detection of single cells and the discrepancies, both qualitative and quantitative, were discussed. These results indicate that, while broadband electrical detection at the single-cell level is becoming feasible, many challenges remain in impedance match, calibration, sensitivity, cell manipulation, solution effect and modeling.
Dr. James Hwang is Professor of Electrical Engineering and Director of Compound- Semiconductor Technology Laboratory at Lehigh University. He graduated with a B.S. degree in Physics from National Taiwan University in 1970, and completed M.S. (1973) and Ph.D. (1976) studies in Materials Science at Cornell University. After twelve years of industrial experience at IBM, AT&T, GE, and GAIN, he joined Lehigh in 1988. He cofounded GAIN and QED; the latter became a public company (IQE). He has been a Nanyang Professor at Nanyang Technological University in Singapore, as well as an advisory professor at Shanghai Jiao Tong University, East China Normal University, and University of Science and Technology in China. Most recently, he was a Program Officer for GHz-THz Electronics at the Air Force Office of Scientific Research. He is a fellow of the Institute of Electrical and Electronic Engineers. He has published ~300 refereed technical papers and has been granted five U. S. patents.